Projection display metrology at NIST: measurements and diagnostics

Author(s):

• Boynton, P.A. ( National Institute of Standards and Technology (USA) )
• Kelley, E.F. ( National Institute of Standards and Technology (USA) )
• Libert, J.M. ( National Institute of Standards and Technology (USA) )

Publication title:

Liquid Crystal Materials, Devices, and Applications X and Projection Displays X

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5289

Pub. Year:

2004

Page(from):

302

Page(to):

313

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451927 [0819451924]

Language:

English

Call no.:

P63600/5289

Type:

Conference Proceedings