Extending focus of optical microscopy and application

Extending focus of optical microscopy and application

Author(s):

Wang, J. ( Tianjin Univ. (China) )
Liu, W. ( Tianjin Univ. (China) )
Cai, H. ( Tianjin Univ. (China) )
Liu, M. ( Tianjin Univ. (China) )
Li, R. ( Tianjin Univ. (China) )

Publication title:

Third International Symposium on Multispectral Image Processing and Pattern Recognition

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5286

Pub. Year:

2003

Page(from):

654

Page(to):

657

Pages:

4

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451811 [0819451819]

Language:

English

Call no.:

P63600/5286.2

Type:

Conference Proceedings

Details

TDL ID:	ZA00013631
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Multispectral Image Processing and Pattern Recognition
Conf. info. (Number):	2003 : 3rd
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2003.10.20-2003.10.22

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