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Binary trademark retrieval using entropy and moments

Author(s):
  • Huang, Y. ( Nanjing Univ. of Aeronautics and Astronautics (China) )
  • Guo, L. ( Nanjing Univ. of Science and Technology (China) )
  • Yang, J. ( Nanjing Univ. of Science and Technology (China) )
Publication title:
Third International Symposium on Multispectral Image Processing and Pattern Recognition
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5286
Pub. Year:
2003
Page(from):
338
Page(to):
342
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451811 [0819451819]
Language:
English
Call no.:
P63600/5286.1
Type:
Conference Proceedings

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