Atomic force microscopy investigation of supramolecular self-assembly of the porphyrin nanotubules
- Author(s):
- Snitka, V. ( Kaunas Univ. of Technology (Lithuania) )
- Rodaite, R. ( Kaunas Univ. of Technology (Lithuania) )
- Ulcinas, A. ( Kaunas Univ. of Technology (Lithuania) )
- Mizariene, V. ( Kaunas Univ. of Technology (Lithuania) )
- Publication title:
- BioMEMS and nanotechnology : 10-12 December 2003, Perth, Australia
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5275
- Pub. Year:
- 2004
- Page(from):
- 37
- Page(to):
- 40
- Pages:
- 4
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451682 [0819451681]
- Language:
- English
- Call no.:
- P63600/5275
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Materials surface topography and composition imaging using dynamic atomic force microscopy
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Development of a Self-Excited Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
American Society of Mechanical Engineers |
3
Conference Proceedings
Laser-pulse-induced chemical reactions and surface patterning in Co-Si and Co-Ti-Si films: investigations by x-ray diffraction and atomic force microscopy
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
10
Conference Proceedings
Direct observation of supramolecular structures of biorelated materials by atomic force microscopy
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Investigation of Epitaxial GaN Films by Conductive Atomic Force Microscopy
Materials Research Society |
6
Conference Proceedings
Characterization of porous silicon for solar cell application by atomic force microscopy
SPIE - The International Society for Optical Engineering |
12
Conference Proceedings
Application of atomic force microscopy for investigation of magnetic structure of steels
SPIE - The International Society for Optical Engineering |