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Charging/discharging induced premature breakdown/recovery in Si nanocrystals embedded in SiO2 matrix

Author(s):
  • Ng, C.Y. ( Nanyang Technological Univ. (Singapore) )
  • Liu, Y. ( Nanyang Technological Univ. (Singapore) )
  • Chen, T.P. ( Nanyang Technological Univ. (Singapore) )
  • Tse, M.S. ( Nanyang Technological Univ. (Singapore) )
Publication title:
BioMEMS and nanotechnology : 10-12 December 2003, Perth, Australia
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5275
Pub. Year:
2004
Page(from):
18
Page(to):
23
Pages:
6
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451682 [0819451681]
Language:
English
Call no.:
P63600/5275
Type:
Conference Proceedings

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