Electric-field enhancement by nodular defects in multilayer coatings irradiated at normal and 45° incidence

Electric-field enhancement by nodular defects in multilayer coatings irradiated at normal and 45° incidence

Author(s):

Stolz, C.J. ( Lawrence Livermore National Lab. (USA) )
Genin, F.Y. ( Lawrence Livermore National Lab. (USA) )
Pistor, T.V. ( Panoramic Technology, Inc. (USA) )

Publication title:

Laser-Induced Damage in Optical Materials: 2003

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5273

Pub. Year:

2004

Page(from):

41

Page(to):

49

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451637 [0819451630]

Language:

English

Call no.:

P63600/5273

Type:

Conference Proceedings

Details

TDL ID:	ZA00013615
Series ID:	PA00000029
Conf. info. (Name):	Laser Damege : Laser-Induced Damage in Optical Materials ; Annual Boulader Damage Symposium
Conf. info. (Number):	2003 ; 35rh
Conf. info. (Venue):	Boulder, CO, USA
Conf. info. (Date):	2003.09.22-2003.09.24

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