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Volume holographic imaging for surface metrology with long working distances

Author(s):
  • Sinha, A. ( Massachusetts Institute of Technology (USA) )
  • Sun, W. ( Massachusetts Institute of Technology (USA) )
  • Shih, T. ( Massachusetts Institute of Technology (USA) )
  • Barbastathis, G. ( Massachusetts Institute of Technology (USA) )
Publication title:
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5265
Pub. Year:
2004
Page(from):
61
Page(to):
68
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451538 [0819451533]
Language:
English
Call no.:
P63600/5265
Type:
Conference Proceedings

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