Blank Cover Image

Detection and impact of mask manufacturing constraints on OPC efficacy

Author(s):
LaCour, P.J. ( Mentor Graphics Corp. (USA) )  
Publication title:
23rd Annual BACUS Symposium on Photomask Technology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5256
Pub. Year:
2003
Page(from):
777
Page(to):
784
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451439 [0819451436]
Language:
English
Call no.:
P63600/5256.2
Type:
Conference Proceedings

Similar Items:

Schulze, S.F., LaCour, P.J., Rodriguez, N.

SPIE-The International Society for Optical Engineering

Martin, P. M., Progler, C. J., Cangemi, M., Adam K, Bailey G, LaCour P

SPIE - The International Society of Optical Engineering

Sturtevant, J. L., Word, J., LaCour, P., Park, J. W., Smith, D.

SPIE - The International Society of Optical Engineering

Kimmel,K.R., Hughes,P.J.

SPIE-The International Society for Optical Engineering

Staud,W., Huang,K., Beard,P., Hebron,O., Eran,Y.

SPIE-The International Society for Optical Engineering

9 Conference Proceedings Evaluation of OPC efficacy

Schellenberg,F.M., Zhang,H., Morrow,J.

SPIE-The International Society for Optical Engineering

Sturtevant, J. L., Torres, J. A., Word, J., Granik, Y., LaCour, P.

SPIE - The International Society of Optical Engineering

Jang, S.-H., Zinn, S.Y., Ki, W.-T., Choi, J.-H., Jeon, C-U., Choi, S.-W., Yoon, H,-S., Sohn, J.M., Oh, Y.-H., Lee, …

SPIE-The International Society for Optical Engineering

Burns, R. L., Cui, Y., Zhao, Z., Stobert, I., LaCour, P., Yehia, A., Madkour, K., Gheith , M., Seoud, A.

SPIE - The International Society of Optical Engineering

Tsuzuki,M., Nozaki,W., Akima,S., Yoshida,J., Oi,Y., Yamada,Y., Matsuzawa,Y.

SPIE-The International Society for Optical Engineering

6 Conference Proceedings Implementation issues for production OPC

Schellenberg, F. M., LaCour, P.

SPIE - The International Society of Optical Engineering

Jeong,S., Idir,M., Johnson,L.E., Lin,Y., Batson,P.J., Levesque,R., Kearney,P.A., Yan,P., Gullikson,E.M., Underwood,J.H., …

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12