Examination of various endpoint methods for chrome mask etch
- Author(s):
Collard, C. ( Etec Systems, Inc., an Applied Materials Co. (USA) ) Anderson, S.A. ( Etec Systems, Inc., an Applied Materials Co. (USA) ) Anderson, R.B., III ( Etec Systems, Inc., an Applied Materials Co. (USA) ) Clevenger, J.O. ( Etec Systems, Inc., an Applied Materials Co. (USA) ) Halim, M. ( Etec Systems, Inc., an Applied Materials Co. (USA) ) Brooks, C.B. ( Etec Systems, Inc., an Applied Materials Co. (USA) ) Buie, M.J. ( Etec Systems, Inc., an Applied Materials Co. (USA) ) Sahin, T. ( Etec Systems, Inc., an Applied Materials Co. (USA) ) - Publication title:
- 23rd Annual BACUS Symposium on Photomask Technology
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5256
- Pub. Year:
- 2003
- Page(from):
- 744
- Page(to):
- 748
- Pages:
- 5
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451439 [0819451436]
- Language:
- English
- Call no.:
- P63600/5256.2
- Type:
- Conference Proceedings
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