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Original optical metrologies of large components

Author(s):
Cimma, B. ( SMA-VIRGO (France) )
Forest, D. ( SMA-VIRGO (France) )
Ganau, P. ( SMA-VIRGO (France) )
Lagrange, B. ( SMA-VIRGO (France) )
Mackowski, J.-M. ( SMA-VIRGO (France) )
Michel, C. ( SMA-VIRGO (France) )
Montorio, J.-L. ( SMA-VIRGO (France) )
Morgado, N. ( SMA-VIRGO (France) )
Pignard, R. ( SMA-VIRGO (France) )
Pinard, L. ( SMA-VIRGO (France) )
Remillieux, A. ( SMA-VIRGO (France) )
6 more
Publication title:
Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5252
Pub. Year:
2004
Page(from):
322
Page(to):
333
Pages:
12
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451361 [0819451363]
Language:
English
Call no.:
P63600/5252
Type:
Conference Proceedings

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