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Picometer-resolution assessment of the period constancy in a FBG phase mask

Author(s):
  • Jourlin, Y. ( Univ. Jean Monnet Saint-Etienne (France) and LTSI-CNRS (France) )
  • Tishchenko, A.V. ( Univ. Jean Monnet Saint-Etienne (France) and LTSI-CNRS (France) )
  • Pedri, C. ( Univ. Jean Monnet Saint-Etienne (France) and LTSI-CNRS (France) )
  • Zanzal, A.G. ( Photronics, Inc. (USA) )
  • Unruh, J. ( Photronics, Inc. (USA) )
Publication title:
Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5252
Pub. Year:
2004
Page(from):
166
Page(to):
173
Pages:
8
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451361 [0819451363]
Language:
English
Call no.:
P63600/5252
Type:
Conference Proceedings

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