Photothermal facility for optical characterization of DUV materials
- Author(s):
- Gallais, L. ( Institut Fresnel, CNRS-ENSPM (France) )
- Hinsch, H. ( Institut Fresnel, CNRS-ENSPM (France) )
- Lay, M.-L. ( Institut Fresnel, CNRS-ENSPM (France) )
- Commandre, M. ( Institut Fresnel, CNRS-ENSPM (France) )
- Publication title:
- Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5250
- Pub. Year:
- 2004
- Page(from):
- 597
- Page(to):
- 602
- Pages:
- 6
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451347 [0819451347]
- Language:
- English
- Call no.:
- P63600/5250
- Type:
- Conference Proceedings
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