Correlation between laser-induced-damage and nanosized absorbing defects

Correlation between laser-induced-damage and nanosized absorbing defects

Author(s):

Bertussi, B. ( Institut Fresnel, CNRS-ENSPM (France) )

Natoli, J.-Y. ( Institut Fresnel, CNRS-ENSPM (France) )

During, A. ( Institut Fresnel, CNRS-ENSPM (France) )

Commandre, M. ( Institut Fresnel, CNRS-ENSPM (France) )

Gallais, L. ( Institut Fresnel, CNRS-ENSPM (France) )

Rullier, J.L. ( CEA-DIF (France) )

Bercegol, H. ( CEA-CESTA (France) )

Bouchut, P. ( CEA-LETI (France) )

3 more

Publication title:

Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5250

Pub. Year:

2004

Page(from):

575

Page(to):

580

Pages:

6

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451347 [0819451347]

Language:

English

Call no.:

P63600/5250

Type:

Conference Proceedings

Details

TDL ID:	ZA00013595
Series ID:	PA00000029
Conf. info. (Name):	SPIE Optical Systems Design : Advances in optical thin films
Conf. info. (Number):	2003
Conf. info. (Venue):	St. Etienne, France
Conf. info. (Date):	2003.09.30-2003.10.03

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