Monitoring the last two (AR) layers in narrow-bandpass filters

Monitoring the last two (AR) layers in narrow-bandpass filters

Author(s):: Willey, R.R. ( Willey Optical, Consultants (USA) )
Publication title:: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 5250
Pub. Year:: 2004
Page(from):: 400
Page(to):: 405
Pages:: 6
Pub. info.:: Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819451347 [0819451347]
Language:: English
Call no.:: P63600/5250
Type:: Conference Proceedings

Details

TDL ID:	ZA00013595
Series ID:	PA00000029
Conf. info. (Name):	SPIE Optical Systems Design : Advances in optical thin films
Conf. info. (Number):	2003
Conf. info. (Venue):	St. Etienne, France
Conf. info. (Date):	2003.09.30-2003.10.03

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