Blank Cover Image

Combining multivariate statistics and speckle reduction for line detection in multichannel SAR images

Author(s):
Publication title:
SAR image analysis, modeling, and techniques VI : 8 September 2003, Barcelona, Spain
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5236
Pub. Year:
2004
Page(from):
93
Page(to):
104
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451194 [0819451193]
Language:
English
Call no.:
P63600/5236
Type:
Conference Proceedings

Similar Items:

Borghys,D.C., Perneel,C., Acheroy,M.P.J.

SPIE-The International Society for Optical Engineering

Stippel, G., Philips, W.R., Lemahieu, I.L.

SPIE-The International Society for Optical Engineering

Borghys,D.C., Perneel,C., Acheroy,M.P.

SPIE-The International Society for Optical Engineering

Pizurica, A., Zlokolica, V., Philips, W.

SPIE - The International Society of Optical Engineering

Borghys,D.C., Perneel,C., Acheroy,M.P.

SPIE-The International Society for Optical Engineering

Pizurica, A., Philips, W.

SPIE - The International Society of Optical Engineering

D. Borghys, M. Shimoni, C. Perneel

Society of Photo-optical Instrumentation Engineers

10 Conference Proceedings SAR speckle reduction for image analysis

Wang,C., Wang,R.

SPIE-The International Society for Optical Engineering

Borghys,D.C., Verlinde,P.S., Perneel,C., Acheroy,M.P.

SPIE-The International Society for Optical Engineering

J. Rombaut, A. Pizurica, W. Philips

SPIE - The International Society of Optical Engineering

Borghys, D., Shimoni, M., Perneel, C.

SPIE - The International Society of Optical Engineering

Pizurica, A., Philips, W., Scheunders, P.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12