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Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element

Author(s):
  • Mihaylova, E.M. ( Dublin Institute of Technology (Ireland) )
  • Toal, V. ( Dublin Institute of Technology (Ireland) )
  • Guntaka, S.R. ( Dublin Institute of Technology (Ireland) )
  • Martin, S. ( Dublin Institute of Technology (Ireland) )
Publication title:
12th International School on Quantum Electronics: Laser Physics and Applications
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5226
Pub. Year:
2003
Page(from):
209
Page(to):
213
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450999 [0819450995]
Language:
English
Call no.:
P63600/5226
Type:
Conference Proceedings

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