Blank Cover Image

Watermark detection rate and outliers

Author(s):
  • Kim, H.J. ( Kangwon National Univ. (South Korea) )
  • Kim, T. ( Kangwon National Univ. (South Korea) )
  • Yeo, I.K. ( Chonbuk National Univ. (South Korea) )
Publication title:
Mathematics of Data/Image Coding, Compression, and Encryption VI, with Applications
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5208
Pub. Year:
2004
Page(from):
187
Page(to):
195
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450814 [0819450812]
Language:
English
Call no.:
P63600/5208
Type:
Conference Proceedings

Similar Items:

Yeo,I.-K., Kim,H.J.

SPIE-The International Society for Optical Engineering

Stach, J., Brundage, T.J., Hannigan, B.T., Bradley, B.A., Kirk, T., Brunk, H.

SPIE-The International Society for Optical Engineering

Kim, J. -T., Lee, H. -Y., Lee, H. -K., Choi, B. -H.

SPIE - The International Society of Optical Engineering

Hwang, Y., Moon, K.A., Kim, M.J.

SPIE-The International Society for Optical Engineering

J.I. Lee, J.H. Lee, S.H. Park, H.S. Choi, H. Cho, H.H. Jo, S.K. Kim, H.C. Kwon, J.E. Hong

Trans Tech Publications

Jun, M. C., Jeong, H., Kuo, C. -C. J.

SPIE - The International Society of Optical Engineering

Kim, K.-T., Choi, J.-H., Kim, S.-G., Choi, J.-U.

SPIE - The International Society of Optical Engineering

Kim,T.-H., Kim,J.-J., Kim,E.-S.

SPIE-The International Society for Optical Engineering

Kim, K.-T., Choi, J.-H., Kim, J.-W., Choi, J.-U., Kim, E.-S.

SPIE - The International Society of Optical Engineering

Song, H.S., Kim, I.K., Cho, N.I.

SPIE-The International Society for Optical Engineering

Choi,H., Lee,K., Kim,T.

SPIE-The International Society for Optical Engineering

Shin, J.C., Choi, W.J., Han, I.K., Park, Y.J., Lee, J.I., Kim, E.K., Kim, H.J., Choi, J.W.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12