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Analysis of objective video quality metric using wavelet transform

Author(s):
  • Lee, C. ( Yonsei Univ. (South Korea) )
  • Choe, J. ( Yonsei Univ. (South Korea) )
  • Ahn, W. ( Yonsei Univ. (South Korea) )
  • Jeong, T. ( Yonsei Univ. (South Korea) )
  • Cho, S. ( Yonsei Univ. (South Korea) )
Publication title:
Applications of digital image processing XXVI : 5-8 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5203
Pub. Year:
2003
Page(from):
63
Page(to):
70
Pages:
8
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450760 [0819450766]
Language:
English
Call no.:
P63600/5203
Type:
Conference Proceedings

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