Traceable radius of curvature measurements on a micro-interferometer

Traceable radius of curvature measurements on a micro-interferometer

Author(s):

Karodkar, D. ( Univ. of North Carolina/Charlotte (USA) )
Gardner, N. ( Univ. of North Carolina/Charlotte (USA) )
Bergner, B.C. ( Univ. of North Carolina/Charlotte (USA) )
Davies, A. ( Univ. of North Carolina/Charlotte (USA) )

Publication title:

Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5180

Pub. Year:

2003

Page(from):

261

Page(to):

273

Pages:

13

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450531 [0819450537]

Language:

English

Call no.:

P63600/5180

Type:

Conference Proceedings

Details

TDL ID:	ZA00013554
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Optical Manufacturing and Testing
Conf. info. (Number):	2003 : 5th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.08.03-2003.08.05

Similar Items:

1 Conference Proceedings Compact inteferometer for micro-optic performance and shape characterization Medicus, K. M., Karodkar, D., Bergner, B. C., Gardner, N., Davies, A. SPIE-The International Society for Optical Engineering	7 Conference Proceedings Defining the measurand in radius of curvature measurements Davies, A., Schmitz, T. L. SPIE-The International Society for Optical Engineering
2 Conference Proceedings Measurement advances for micro-refractive fabrication (Invited Paper) [5858-25] Gardner, N., Davies, A., Bergner, B. SPIE - The International Society of Optical Engineering	8 Conference Proceedings Ray-trace simulation of the random ball test to improve microlens metrology [6292-04] Gardner, N. W., Davies, A. D. SPIE - The International Society of Optical Engineering
3 Conference Proceedings Improving metrology for micro-optics manufacturing (Invited Paper) Davies, A.D., Bergner, B.C., Gardner, N.W. SPIE-The International Society for Optical Engineering	9 Conference Proceedings Radius case study: optical bench measurement and uncertainty including stage error motions [5879-11] Schmitz, T. L., Gardner, N., Vaughn, M., Davies, A. SPIE - The International Society of Optical Engineering
4 Conference Proceedings Self-calibration technique for transmitted wavefront measurements Bergner, B.C., Davies, A. SPIE - The International Society of Optical Engineering	10 Conference Proceedings Retrace error evaluation on a figure-measuring interferometer [5869-35] Gardner, N., Davies, A. SPIE - The International Society of Optical Engineering
5 Conference Proceedings Uncertainties in interferometric measurements of radius of curvature Schmitz,T.L., Davies,A.D., Evans,C.J. SPIE-The International Society for Optical Engineering	11 Conference Proceedings Gaussian beam modelling of the radius of curvature [5879-10] Medicus, K. M., Snyder, J., Davies, A. D. SPIE - The International Society of Optical Engineering
6 Conference Proceedings High-resolution measurement of the free spectral range of an etalon Knight, P.D., Crua-Cabrera, A., Bergner, B.C. SPIE-The International Society for Optical Engineering	12 Conference Proceedings Self-calibration for microrefractive lens measurements Gardner, N., Randolph, T., Davies, A. SPIE - The International Society of Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12