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Prediction of MRF polishing by classification of the initial error with Zernike polynomials

Author(s):
Pitschke, E. ( Univ. of Applied Sciences Deggendorf (Germany) and Univ. of the West of England (United Kingdom) )
Sperber, P. ( Univ. of Applied Sciences Deggendorf (Germany) )
Stamp, R. ( Univ. of the West of England (United Kingdom) )
Rascher, R. ( Univ. of Applied Sciences Deggendorf (Germany) )
Smith, L. ( Univ. of the West of England (United Kingdom) )
Smith, M. ( Univ. of the West of England (United Kingdom) )
Schinhaerl, M. ( Univ. of Applied Sciences Deggendorf (Germany) )
2 more
Publication title:
Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5180
Pub. Year:
2003
Page(from):
115
Page(to):
122
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450531 [0819450537]
Language:
English
Call no.:
P63600/5180
Type:
Conference Proceedings

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