Calibration of hard x-ray (15 - 50 keV) optics at the MPE test facility PANTER | 東京工業大学附属図書館文献データベース

Calibration of hard x-ray (15 - 50 keV) optics at the MPE test facility PANTER

Author(s):

Braeuninger, H. ( Max-Planck-Institut fuer extraterrestrische Physik (Germany) )

Burkert, W. ( Max-Planck-Institut fuer extraterrestrische Physik (Germany) )

Hartner, G.D. ( Max-Planck-Institut fuer extraterrestrische Physik (Germany) )

Citterio, O. ( Osservatorio Astronomico di Brera (Italy) )

Ghigo, M. ( Osservatorio Astronomico di Brera (Italy) )

Mazzoleni, F. ( Osservatorio Astronomico di Brera (Italy) )

Pareschi, G. ( Osservatorio Astronomico di Brera (Italy) )

Spiga, D. ( Osservatorio Astronomico di Brera (Italy) )

3 more

Publication title:

Optics for EUV, X-Ray, and gamma-ray astronomy : 4-7 August 2003, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5168

Pub. Year:

2004

Page(from):

283

Page(to):

293

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450418 [0819450413]

Language:

English

Call no.:

P63600/5168

Type:

Conference Proceedings

Details

TDL ID:	ZA00013547
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Optics for EUV, X-Ray, and Gamma-Ray Astronomy
Conf. info. (Number):	2003
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.08.04-2003.08.07

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