Blank Cover Image

Subpixel resolution with the multispectral thermal imager (MTI)

Author(s):
Publication title:
Imaging spectrometry IX : 6-7 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5159
Pub. Year:
2003
Page(from):
147
Page(to):
157
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450326 [0819450324]
Language:
English
Call no.:
P63600/5159
Type:
Conference Proceedings

Similar Items:

Nandy, P., Post, B.N., Smith, J.L., Decker, M.L.

SPIE - The International Society of Optical Engineering

Wilson, M., Nandy, P., Post, B., Smith, J., Wehlburg, J.

SPIE - The International Society of Optical Engineering

Kay,R.R., Bender,S.C., Henson,T.D., Byrd,D.A., Rienstra,J.L., Decker,M.L., Rackley,N.G., Akau,R.L., Claassen,P.J., …

SPIE - The International Society for Optical Engineering

Balick,L.K., Hirsch,K.L., McLachlan,P.M., Borel,C.C., Clodius,W.B., Villanueve,P.V.

SPIE-The International Society for Optical Engineering

Decker,M.L., Kay,R.R., Rackley,N.G.

SPIE-The International Society for Optical Engineering

Decker, M.L., Kay, R.R., Brock, B.C.

SPIE - The International Society of Optical Engineering

Weber,P.G., Brock,B.C., Garrett,A.J., Smith,B.W., Borel,C.C., Clodius,W.B., Bender,S.C., Kay,R.R., Decker,M.L.

SPIE - The International Society for Optical Engineering

Bruandet,J.-P., Dinten,J.-M.

SPIE - The International Society for Optical Engineering

Decker, M., Rackley, N.

American Institute of Aeronautics and Astronautics

Vora,P.L., Harville,M.L., Farrell,J.E., Tietz,J.D., Brainard,D.H.

SPIE-The International Society for Optical Engineering

Salazar, J.S., Smith, J.L.

SPIE-The International Society for Optical Engineering

Pienkowski, M.C., Jenkins, M.L., Hutchison, J.L., Moseley, P.T.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12