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Optical correction for multiple back reflections in an automated spectroradiometric measurement system

Author(s):
  • Garland, W.C. ( Optical Sciences Ctr./Univ. of Arizona (USA) )
  • Biggar, S.F. ( Optical Sciences Ctr./Univ. of Arizona (USA) )
  • Zalewski, E.F. ( Optical Sciences Ctr./Univ. of Arizona (USA) )
  • Thome, K.J. ( Optical Sciences Ctr./Univ. of Arizona (USA) )
Publication title:
Imaging spectrometry IX : 6-7 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5159
Pub. Year:
2003
Page(from):
82
Page(to):
90
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450326 [0819450324]
Language:
English
Call no.:
P63600/5159
Type:
Conference Proceedings

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