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Active detection of off-diagonal Mueller elements of rough targets

Author(s):
Hoover, B.G. ( Applied Technology Associates (USA) )
Dayton, D.C. ( Applied Technology Associates (USA) )
Havey, J.E. ( Applied Technology Associates (USA) )
Gonglewski, J.D. ( Air Force Research Lab. (USA) )
Gamiz, V.L. ( Air Force Research Lab. (USA) )
Ulibarri, L.J. ( Air Force Research Lab. (USA) )
1 more
Publication title:
Polarization science and remote sensing : 3-5 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5158
Pub. Year:
2003
Page(from):
226
Page(to):
238
Pages:
13
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450319 [0819450316]
Language:
English
Call no.:
P63600/5158
Type:
Conference Proceedings

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