Polarized light diffusely scattered under smooth and rough interfaces

Polarized light diffusely scattered under smooth and rough interfaces

Author(s):: Germer, T.A. ( National Institute of Standards and Technology (USA) )
Publication title:: Polarization science and remote sensing : 3-5 August 2003, San Diego, California, USA
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 5158
Pub. Year:: 2003
Page(from):: 193
Page(to):: 204
Pages:: 12
Pub. info.:: Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819450319 [0819450316]
Language:: English
Call no.:: P63600/5158
Type:: Conference Proceedings

Details

TDL ID:	ZA00013537
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Polarization Science and Remote Sensing
Conf. info. (Number):	2003
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.08.03-2003.08.05

Similar Items:

1 Conference Proceedings Polarization of light scattered by spheres on a dielectric film Sung,L., Mulholland,G.W., Germer,T.A. SPIE - The International Society for Optical Engineering	7 Conference Proceedings Polarized light scattering from metallic particles on silicon wafers Kim,J.H., Ehrman,S.H., Mulholland,G.W., Germer,T.A. SPIE-The International Society for Optical Engineering
2 Conference Proceedings Polarization of light scattered by particles on silicon wafers Sung,L., Mulholland,C.W., Germer,T.A. SPIE - The International Society for Optical Engineering	8 Conference Proceedings Hemispherical imaging of skin with polarized light J. C. Ramella-Roman, B. Boulbry, T. A. Germer SPIE - The International Society of Optical Engineering
3 Conference Proceedings Polarized light-scattering measurements of polished and etched steel surfaces Germer,T.A., Rinder,T., Rothe,H. SPIE - The International Society for Optical Engineering	9 Conference Proceedings Angular intensity correlation functions C1 and C10 for the scattering of S-polarized light from a I D randomly rough dielectric surface Simonsen,I., Maradudin,A.A., Leskova,T.A. SPIE - The International Society for Optical Engineering
4 Conference Proceedings Characterizing surface roughness of thin films by polarized light scattering Germer, T.A., Fasolka, M.J. SPIE - The International Society of Optical Engineering	10 Conference Proceedings Enhanced backscattering of light from a randomly rough interface between a dipole-active medium and a dielectric Leskova,T.A., Maradudin,A.A., Shchegrov,A.V. SPIE-The International Society for Optical Engineering
5 Conference Proceedings Multidetector hemispherical polarized optical scattering instrument Germer,T.A. SPIE - The International Society for Optical Engineering	11 Conference Proceedings Monte Carlo simulation of the diffusely scattered polarized light in turbid media Wang, S., Xu, L., Li, H., Xie, S. SPIE - The International Society of Optical Engineering
6 Conference Proceedings Measurement of lithographic overlay by light-scattering ellipsometry Germer, T.A. SPIE-The International Society for Optical Engineering	12 Conference Proceedings Application of bidirectional ellipsometry to the characterization of roughness and defects in dielectric layers Germer,T.A. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12