Polarization imaging using active illumination and lock-in like algorithms
- Author(s):
- Gypson, M. ( ITT Industries, Inc. (USA) )
- Dobbs, M. ( ITT Industries, Inc. (USA) )
- Pruitt, J. ( ITT Industries, Inc. (USA) )
- Neff, B. ( ITT Industries, Inc. (USA) )
- Fennelly, J. ( ITT Industries, Inc. (USA) )
- Publication title:
- Polarization science and remote sensing : 3-5 August 2003, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5158
- Pub. Year:
- 2003
- Page(from):
- 161
- Page(to):
- 167
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819450319 [0819450316]
- Language:
- English
- Call no.:
- P63600/5158
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Practical aspects of image system validation using trans-illumination [6271-57]
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Validation of design for space-based tunable diode laser absorption spectroscopy payload
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Thermal considerations of free-space optical interconnects using VCSEL-based smart pixel arrays
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
5
Conference Proceedings
Subsurface imaging using the spectral polarization difference technique and NIR illumination
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Mode-locked fiber laser using the Sagnac interferometer and the nonlinear polarization rotation
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |