Polarimetric characterization of semiconductor materials for photodetector applications

Polarimetric characterization of semiconductor materials for photodetector applications

Author(s):

McAdoo, J.A. ( ITT Industries (USA) )
Fennelly, J.A. ( ITT Industries (USA) )
Goldstein, D.H. ( Air Force Research Lab. (USA) )
Chenault, D.B. ( SY Technology, Inc./L-3 Communications Corp., Inc. (USA) )

Publication title:

Polarization science and remote sensing : 3-5 August 2003, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5158

Pub. Year:

2003

Page(from):

125

Page(to):

134

Pages:

10

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450319 [0819450316]

Language:

English

Call no.:

P63600/5158

Type:

Conference Proceedings

Details

TDL ID:	ZA00013537
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Polarization Science and Remote Sensing
Conf. info. (Number):	2003
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.08.03-2003.08.05

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