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A new reliability mechanism observed on Al gate based PHEMT structure

Author(s):
Martin, N. ( Alcatel Space Industries, Toulouse, France )
Rogeaux, E. ( Alcatel Space Industries, Toulouse, France )
Bensoussan, A. ( Alcatel Space Industries, Toulouse, France )
Badoch, J.L. ( Alcatel Space Industries, Toulouse, France )
Rieunau, G. ( Alcatel Space Industries, Toulouse, France )
Muraro, J.L. ( Alcatel Space Industries, Toulouse, France )
Brasseau, F. ( Alcatel Space Industries, Toulouse, France )
Fellon, P. ( United Monolithic Semiconductors, Orsay, France )
Pataut, G. ( United Monolithic Semiconductors, Orsay, France )
4 more
Publication title:
Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France
Title of ser.:
ESA SP
Ser. no.:
507
Pub. Year:
2002
Page(from):
63
Page(to):
66
Pages:
4
Pub. info.:
Noordwijk, The Netherlands: ESA Publications Division
ISSN:
03796566
ISBN:
9789290928171 [9290928174]
Language:
English
Call no.:
E11690/507
Type:
Conference Proceedings

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