Using Electron Backscatter Diffraction (EBSD) to Measure Misorientation between ‘Parent’ and ‘Daughter’ Grains. Implications for Recrystallisation and Nucleation

Using Electron Backscatter Diffraction (EBSD) to Measure Misorientation between ‘Parent’ and ‘Daughter’ Grains. Implications for Recrystallisation and Nucleation

Author(s):

Publication title:

Recrystallization and grain growth : SF2M : proceedings of the second Joint International Conference on Recrystallization and Grain Growth, ReX & GG2, SF2M, held in Annecy, France, 30th August - 3rd September 2004

Title of ser.:

Materials science forum

Ser. no.:

467-470

Pub. Year:

2004

Page(from):

573

Page(to):

578

Pages:

6

Pub. info.:

Uetikon-Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499526 [0878499520]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00013368
Series ID:	PA00000012
Conf. info. (Name):	Joint International Conference on Recrystallization and Grain Growth
Conf. info. (Number):	2nd
Conf. info. (Venue):	Annecy, France
Conf. info. (Date):	2004.08.30-2004.09.03

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