Depth Dependence of Defects in Ion-Implanted Si Probed by a Positron Beam
- Author(s):
Fujinami, M. Miyagoe, T. Sawada, T. Suzuki, R. Ohdaira, T. Akahane, T. - Publication title:
- Positron annihilation ICPA-13 : proceedings of the 13th International Conference on Positron Annihilation, Kyoto, Japan, September 2003
- Title of ser.:
- Materials science forum
- Ser. no.:
- 445-446
- Pub. Year:
- 2004
- Page(from):
- 78
- Page(to):
- 80
- Pages:
- 3
- Pub. info.:
- Uetikon-Zuerich: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878499366 [0878499369]
- Language:
- English
- Call no.:
- M23650
- Type:
- Conference Proceedings
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