Problems Related to Energy-Dispersive X-Ray Stress Analysis Performed in Reflection Geometry

Problems Related to Energy-Dispersive X-Ray Stress Analysis Performed in Reflection Geometry

Author(s):

Publication title:

ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002

Title of ser.:

Materials science forum

Ser. no.:

404-407

Pub. Year:

2002

Page(from):

13

Page(to):

18

Pages:

6

Pub. info.:

Uetikon-Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499007 [0878499008]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00013337
Series ID:	PA00000012
Conf. info. (Name):	European Conference on Residual Stresses - ECRS
Conf. info. (Number):	6th
Conf. info. (Venue):	Coimbra, Portugal
Conf. info. (Date):	2002.07.10-2002.07.12

Similar Items:

1 Conference Proceedings X-Ray Residual Stress Gradient Analysis under Difficult Conditions - Attempts for Improving the Solution Genzel, Ch., Reimers, W. Trans Tech Publications	7 Conference Proceedings Determination of Real Space Residual Stress Distributions бij(z) of Surface Treated Materials with Diffraction Methods Part II: Energy Dispersive Approach Denks, I.A., Klaus, M., Genzel, C. Trans Tech Publications
2 Conference Proceedings Analysis of Macro and Micro Residual Stresses in Functionally Graded Materials by Diffraction Methods Dantz, D., Genzel, Ch., Reimers, W. Trans Tech Publications	8 Conference Proceedings Analysis of Residual Stress States (Invited Lecture) Reimers, W. Trans Tech Publications
3 Conference Proceedings Improvements in Energy Dispersive Diffraction in Respect of Residual Stress Analysis I.A. Denks, C. Genzel Trans Tech Publications	9 Conference Proceedings A Comparison of Neutron and High Energy Synchrotron Radiation as Tools for Texture and Stress Analysis Pyzalla, A., Reimers, W., Liss, K. -D. Trans Tech Publications
4 Conference Proceedings The Materials Science Beamline EDDI for Energy-Dispersive Analysis of Subsurface Residual Stress Gradients Genzel, C., Denks, I.A., Klaus, M. Trans Tech Publications	10 Conference Proceedings X-Ray Diffraction Analysis of Nonuniform Residual Stress Fields бii(T) under Difficult Conditions Klaus, M., Denks, I.A., Genzel, C. Trans Tech Publications
5 Conference Proceedings Residual Stress Analysis by Energy-Dispersive Synchrotron Diffraction: Concepts for High Resolution Depth Profiling in Real Space T. Fuß, M. Meixner, M. Klaus, C. Genzel Trans Tech Publications	11 Conference Proceedings Bridging Gaps in Surface Zone Residual Stress Analysis Using Complementary Probes for Strain Depth Profiling T. Fuß, R.C. Wimpory, M. Klaus, Ch. Genzel Trans Tech Publications
6 Conference Proceedings Analysis of Texture Depth Distribution by Energy-Dispersive Diffraction R.S. Coelho, M. Klaus, C. Genzel Trans Tech Publications	12 Conference Proceedings Keynote Lecture: Residual Stress Gradient Analysis by Multiple Diffraction Line Methods C. Genzel, D. Apel, M. Klaus, M. Genzel, D. Balzar Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12