The study of fast identifying methods on ECNT

Author(s):

• Sun, X. ( Hebei Univ. of Science and Technology (China) )
• Liu, D. ( Hebei Univ. of Science and Technology (China) )
• Gao, N. ( Hebei Institution of Technology and Vocation (China) )
• Sun, H. ( Hebei Univ. of Science and Technology (China) )
• Sheng, J. ( Xi'an Jiaotong Univ. (China) )

Publication title:

Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5253

Pub. Year:

2003

Page(from):

356

Page(to):

360

Pages:

5

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819451378 [0819451371]

Language:

English

Call no.:

P63600/5253

Type:

Conference Proceedings