Design optimization of compound pendulum system for measurement of microthrust
- Author(s):
- Publication title:
- Fifth International Symposium on Instrumentation and Control Technology : 24-27 October 2003, Beijing, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5253
- Pub. Year:
- 2003
- Page(from):
- 283
- Page(to):
- 286
- Pages:
- 4
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451378 [0819451371]
- Language:
- English
- Call no.:
- P63600/5253
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Study of variant design of SML-based coordinate measuring machines automatic measurement plan [6358-141]
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Controlled Growth of III-V Compound Semiconductor Nano-Structures and Their Application in Quantum-Devices
Trans Tech Publications |
Society of Photo-optical Instrumentation Engineers |
American Society of Mechanical Engineers |
Society of Photo-optical Instrumentation Engineers |
9
Conference Proceedings
Modeling and simulation of optimization design for structure parameters of CCD intersection measurement system
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Development and application of 3D foot-shape measurement system under different loads
Society of Photo-optical Instrumentation Engineers |
10
Conference Proceedings
Design and implementation of a decentralized self-coordinating distributed remote sensing image processing system
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Design of quantum efficiency measurement system for variable doping GaAs photocathode
Society of Photo-optical Instrumentation Engineers |
12
Conference Proceedings
CCD-based system for two-dimensional measurement of color uniformity of LCD projector
SPIE - The International Society of Optical Engineering |