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Beam characterization of commercial red and infrared diode lasers

Author(s):
Publication title:
Advanced topics in optoelectronics, microelectronics, and nanotechnologies : 21-23 November, 2002, Bucharest, Romania
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5227
Pub. Year:
2003
Page(from):
227
Page(to):
232
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819451002 [0819451002]
Language:
English
Call no.:
P63600/5227
Type:
Conference Proceedings

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