Interband structure modeling for oversampled multiresolution analysis-based Pan-sharpening of very high resolution multispectral images

Interband structure modeling for oversampled multiresolution analysis-based Pan-sharpening of very high resolution multispectral images

Author(s):

Garzelli, A. ( Univ. of Siena (Italy) )
Aiazzi, B. ( Institute of Applied Physics Nello Carrara (Italy) )
Alparone, L. ( Univ. of Florence (Italy) )
Baronti, S. ( Institute of Applied Physics Nello Carrara (Italy) )
Nencini, F. ( Univ. of Siena (Italy) )

Publication title:

Wavelets: Applications in Signal and Image Processing X

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5207

Pub. Year:

2003

Vol.:

2

Pt.:

Session 15

Page(from):

678

Page(to):

689

Pages:

12

Pub. info.:

Bellingham, WA: SPIE

ISSN:

0277786X

ISBN:

9780819450807 [0819450804]

Language:

English

Call no.:

P63600/5207

Type:

Conference Proceedings

Details

TDL ID:	ZA00013155
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Wavelets
Conf. info. (Number):	2003 : 10th
Conf. info. (Venue):	San Diego, California, USA
Conf. info. (Date):	2003.08.04-2003.8.8
Note for article:	Session 15. Multi-Scale Image Processing ; 5207-83

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