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Estimation risk of transformation-averaged estimators (Invited Paper)

Author(s):
  • Liu, J. ( Palo Alto Research Ctr. (USA) )
  • Moulin, P. ( Univ. of Illinois/Urbana-Champaign (USA) )
Publication title:
Wavelets: Applications in Signal and Image Processing X
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5207
Pub. Year:
2003
Vol.:
1
Pt.:
Session 2
Page(from):
87
Page(to):
96
Pages:
10
Pub. info.:
Bellingham, WA: SPIE
ISSN:
0277786X
ISBN:
9780819450807 [0819450804]
Language:
English
Call no.:
P63600/5207
Type:
Conference Proceedings

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