Blank Cover Image

Three-wavelength laser light source for absolute sub-Angstrom two-point-source interferometer

Author(s):
Publication title:
Optical Measurement Systems for Industrial Inspection III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5144
Pub. Year:
2003
Page(from):
227
Page(to):
233
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819450142 [0819450146]
Language:
English
Call no.:
P63600/5144
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Characterization of the frequency-modulated continuous wave subsystem of an angstrom-accuracy absolute interferometer

Krieg, L.M., Swinkels, B.L., Braat, J.J.M.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Absolute distance metrology for space interferometers

Swinkels, B. L., Wendrich, T. J., Bhattacharya, N., Wielders, A. A., Braat, J. J. M.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Absolute optical path difference measurement with angstrom accuracy over ranges of millimeters

Krieg,M.L., Klaver,R.G., Braat,J.J.M.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Fast-sampling multipixel detector for a heterodyne interferometer with angstrom precision

Soloviev, O., Vdovin, G.V., Krieg, L.M., Monteiro, D.W.L., Braat, J.J.M., French, P.J.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Inverse propagation algorithm for angstrom accuracy interferometer (Invited Paper)

Krieg, M.L., Braat, J.J.M.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings Two-point diffraction interferometer for absolute distance measurement

Kim, S.-W., Rhee, H.-G., Joo, J.-Y., Kim, Y.-J.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Measurements from a novel interferometer for EUVL mirror substrates [5856-26]

Krieg, M. L., Braat, J. J. M.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Design of laser source for fiber point diffraction interferometer

X. Yu, L. Nie, J. Han, B. Liu, X. Jiang

Society of Photo-optical Instrumentation Engineers
5 Conference Proceedings Absolute distance metrology for space interferometers [5879-23]

Swinkeis, B. L., Latoui, A., Wielders, A. A., Braat, J. J. M.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Extended-source interferometry for at-wavelength testing of EUV optics

Visser,M., Dekker,M., Hegeman,P., Braat,J.J.

SPIE - The International Society for Optical Engineering
6 Conference Proceedings Absolute distance metrology for space interferometers [5856-21]

Swinkels, B. L., Bhattacharya, N., Wielders, A. A., Braat, J. J. M.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings A two-bucket phase-stepped shearing speckle interferometer: Why does it work?

Somers, P.A.A.M., van Brug, H., Braat, J.J.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12