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Ultrasensitivity, speed, and resolution: optimizing low-light microscopy with the back-illuminated electron-multiplying CCD

Author(s):
Publication title:
Confocal, multiphoton, and nonlinear microscopic imaging : 22-23 June 2003, Munich, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5139
Pub. Year:
2003
Page(from):
56
Page(to):
66
Pages:
11
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819450098 [081945009X]
Language:
English
Call no.:
P63600/5139
Type:
Conference Proceedings

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