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Laplace transform photoinduced transient spectroscopy: a new powerful tool for defect characterization in semi-insulating materials

Author(s):
  • Pawlowski, M. ( Institute of Electronic Materials Technology (Poland) )
  • Kaminski, P. ( Institute of Electronic Materials Technology (Poland) )
  • Kozlowski, R. ( Institute of Electronic Materials Technology (Poland) )
  • Miczuga, M. ( Military Univ. of Technology (Poland) )
Publication title:
Solid State Crystals 2002: Crystalline Materials for Optoelectronics
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5136
Pub. Year:
2003
Page(from):
59
Page(to):
65
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819450043 [0819450049]
Language:
English
Call no.:
P63600/5136
Type:
Conference Proceedings

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