Characterization of point defects in semi-insulating InP:Fe by high-resolution photoinduced transient spectroscopy

Characterization of point defects in semi-insulating InP:Fe by high-resolution photoinduced transient spectroscopy

Author(s):

Kozlowski, R. ( Institute of Electronic Materials Technology (Poland) )
Kaminski, P. ( Institute of Electronic Materials Technology (Poland) )
Pawlowski, M. ( Institute of Electronic Materials Technology (Poland) )

Publication title:

Solid State Crystals 2002: Crystalline Materials for Optoelectronics

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5136

Pub. Year:

2003

Page(from):

53

Page(to):

58

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819450043 [0819450049]

Language:

English

Call no.:

P63600/5136

Type:

Conference Proceedings

Details

TDL ID:	ZA00013124
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Solid State Crystals
Conf. info. (Number):	2002 : 3rd
Conf. info. (Venue):	Zakopane, Poland
Conf. info. (Date):	2002.10.14-2002.10.18

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