Blank Cover Image

Detection of cavitation pits on steel surfaces using SEM imagery

Author(s):
Price, J.R. ( Oak Ridge National Lab. (USA) )
Hylton, K.W. ( Oak Ridge National Lab. (USA) )
Tobin, K.W., Jr. ( Oak Ridge National Lab. (USA) )
Bingham, P.R. ( Oak Ridge National Lab. (USA) )
Hunn, J.D. ( Oak Ridge National Lab. (USA) )
Haines, J.R. ( Oak Ridge National Lab. (USA) )
1 more
Publication title:
Sixth International Conference on Quality Control by Artificial Vision
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5132
Pub. Year:
2003
Page(from):
476
Page(to):
484
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449986 [0819449989]
Language:
English
Call no.:
P63600/5132
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Semiconductor sidewall shape estimation using top-down CD-SEM image retrieval

Price, J.R., Bingham, P.R., Tobin, K.W., Jr., Karnowski, T.P.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Spatial heterodyne interferometry techniques and applications in semiconductor water manufacturing

Bingham, P.R., Tobin, K.W., Hanson, G.R., Simpson, J.T.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Estimating cross-section semiconductor structure by comparing top-down SEM images

Price, J.R., Bingham, P.R., Tobin, K.W. Jr.,, Karnowski, T.P.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Optical inspection of coated-particle nuclear fuel

Price, J.R., Hunn, J.D.

SPIE - The International Society of Optical Engineering
3 Conference Proceedings Sidewall structure estimation from CD-SEM for lithographic process control

Bingham, P.R., Price, J.R., Tobin, K.W., Jr., Karnowski, T.P., Bennett, M.H., Bogardus, E.H., Bishop, M.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Accommodating multiple illumination sources in an imaging colorimetry environment

Tobin,K.W.,Jr., Goddard,J.S.,Jr., Hunt,M.A., Hylton,K.W., Karnowski,T.P., Simpson,M.L., Richards,R.K., Treece,D.A.

SPIE - The International Society for Optical Engineering
4 Conference Proceedings Direct to digital holography for semiconductor wafer defect detection and review(Invited Paper)

Thomas, C.E., Jr., Bahm, T.M., Baylor, L.R., Bingham, P.R., Burns, S.W., Chidley, M.D., Dai, X.L., Delahanty, R.J., …

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Imaging tristimulus colorimeter for the evaluation of color in printed textiles

Hunt,M.A., Goddard,J.S.,Jr., Hylton,K.W., Karnowski,T.P., Richards,R.K., Simpson,M.L., Tobin,K.W., Treece,D.A.

SPIE - The International Society for Optical Engineering
5 Conference Proceedings Optical spatial heterodyned interferometry for inspection of microelectromechanical systems

K. W. Tobin, Jr., P. R. Bingham, J. R. Price

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Detection of semiconductor defects using a novel fractal encoding algorithm

Gleason, S.S., Ferrell, R.K., Karnowski, T.P., Tobin, K.W., Jr.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Phase defect detection with spatial heterodyne interferometry

Bingham, P.R., Tobin, K.W., Bennett, M.H., Marmillion, P.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Automatic characterization of cross-sectional coated particle nuclear fuel using greedy coupled Bayesian snakes

J. R. Price, D. Aykac, J. D. Hunn, A. K. Kercher

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12