Blank Cover Image

Two methods for tracking small animals in SPECT imaging

Author(s):
Kerekes, R.A. ( Oak Ridge National Lab. (USA) )
Goddard, J.S. ( Oak Ridge National Lab. (USA) )
Gleason, S.S. ( Oak Ridge National Lab. (USA) )
Paulus, M.J. ( Oak Ridge National Lab. (USA) )
Weisenberger, A.G. ( Thomas Jefferson National Accelerator Facility (USA) )
Smith, M.F. ( Thomas Jefferson National Accelerator Facility (USA) )
Welch, B. ( Thomas Jefferson National Accelerator Facility (USA) )
2 more
Publication title:
Sixth International Conference on Quality Control by Artificial Vision
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5132
Pub. Year:
2003
Page(from):
129
Page(to):
139
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449986 [0819449989]
Language:
English
Call no.:
P63600/5132
Type:
Conference Proceedings

Similar Items:

Baba, J.S., Gleason, S.S., Goddard, J.S., Paulus, M.J.

SPIE - The International Society of Optical Engineering

Izaguirre, E. W., Sun, M., Carver, J., Thompson, S., Hasegawa, B. H.

SPIE - The International Society of Optical Engineering

DiBella,E.V.R., Zhang,G., More,M.J., Goode,A.R., Majewski,S., Wojcik,R.F., Kross,B., Popov,V., Weisenberger,A.G., …

SPIE-The International Society for Optical Engineering

J. Y. Hesterman, M. A. Kupinski, E. Clarkson, D. W. Wilson, H. H. Barrett

SPIE - The International Society of Optical Engineering

Weisenberger,A.G., Bradley,E., Majewski,S., Saha,M.

SPIE-The International Society for Optical Engineering

Kerekes J., Muldowney M., Strackerjan K., Smith L., Leahy B.

SPIE - The International Society of Optical Engineering

Y. Zheng, H. Li, J. Wang, A. V. Stolin, J. Pole, M. B. Williams

SPIE - The International Society of Optical Engineering

Kruse,K.L., Williams,P.T., Allgood,G.O., Ward,R.C., Gleason,S.S., Paulus,M.J., Munro,N.B., Mahinthakumar,G., …

SPIE-The International Society for Optical Engineering

MacDonald, L.R., Iwata, K., Patt, B.E., Iwanczyk, J.S., Hwang, A.B., Wu, M.C., Hasegawa, B.H.

SPIE-The International Society for Optical Engineering

M. Grasruck, S. Bartling, J. Dinkel, F. Kiessling, W. Semmler

Society of Photo-optical Instrumentation Engineers

Gleason,S.S., Sari-Sarraf,H., Paulus,M.J., Johnson,D.K., Abidi,M.A.

SPIE - The International Society for Optical Engineering

Pivovaroff, M. J., Barber, W. B., Christensen, F. E., Craig, W. W., Decker, T., Epstein, M., Funk, T., Hailey, C., …

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12