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State-of-the-art performance of stencil mask for LEEPL

Author(s):
Nohama, S. ( Sony Corp. (Japan) )
Omori, S. ( Sony Corp. (Japan) )
Iwase, K. ( Sony Corp. (Japan) )
Watanabe, Y. ( Sony Corp. (Japan) )
Amai, K. ( Sony Corp. (Japan) )
Sasaki, T. ( Sony Corp. (Japan) )
Moriya, S. ( Sony Corp. (Japan) )
Kitagawa, T. ( Sony Corp. (Japan) )
3 more
Publication title:
Photomask and Next-Generation Lithography Mask Technology X
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5130
Pub. Year:
2003
Page(from):
970
Page(to):
978
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449962 [0819449962]
Language:
English
Call no.:
P63600/5130
Type:
Conference Proceedings

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