New die-to-database inspection algorithm for inspection of 90-nm node reticles
- Author(s):
Garcia, H.I. ( KLA-Tencor Corp. (USA) ) Volk, W.W. ( KLA-Tencor Corp. (USA) ) Watson, S. ( KLA-Tencor Corp. (USA) ) Hess, C. ( KLA-Tencor Corp. (USA) ) Aquino, C. ( KLA-Tencor Corp. (USA) ) Wiley, J. ( KLA-Tencor Corp. (USA) ) Mack, C.A. ( KLA-Tencor Corp. (USA) ) - Publication title:
- Photomask and Next-Generation Lithography Mask Technology X
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5130
- Pub. Year:
- 2003
- Page(from):
- 364
- Page(to):
- 374
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449962 [0819449962]
- Language:
- English
- Call no.:
- P63600/5130
- Type:
- Conference Proceedings
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