Photosensitivity of heterostructure S1-xGex/Si taking into account free-carrier absorption of radiation and length of hot carrier energy path

Photosensitivity of heterostructure S1-xGex/Si taking into account free-carrier absorption of radiation and length of hot carrier energy path

Author(s):: Serebrennikov, P.S. ( Research, Development, and Production Ctr. ORION (Russia) )
Publication title:: 17th international conference on photoelectronics and night vision devices : 27-31 May 2002, Moscow, Russia
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 5126
Pub. Year:: 2003
Page(from):: 364
Page(to):: 366
Pages:: 3
Pub. info.:: Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819449863 [0819449865]
Language:: English
Call no.:: P63600/5126
Type:: Conference Proceedings

Details

TDL ID:	ZA00013114
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Photoelectronics and Night Vision Devices
Conf. info. (Number):	2002 : 17th
Conf. info. (Venue):	Moscow, Russia
Conf. info. (Date):	2002.05.27-2002.05.31

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