Blank Cover Image

Study of low-frequency noise in GaN-on-Si films obtained by laser-assisted debonding (Invited Paper)

Author(s):
  • Chan, C.P. ( Hong Kong Polytechnic Univ. (China) )
  • Lai, P.K. ( Hong Kong Polytechnic Univ. (China) )
  • Leung, B.H. ( Hong Kong Polytechnic Univ. (China) )
  • Yue, T.M. ( Hong Kong Polytechnic Univ. (China) )
  • Surya, C.C. ( Hong Kong Polytechnic Univ. (China) )
Publication title:
Noise in Devices and Circuits
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5113
Pub. Year:
2003
Page(from):
328
Page(to):
341
Pages:
14
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449733 [0819449733]
Language:
English
Call no.:
P63600/5113
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Nature Of Low-Frequency Excess Noise In n-Type Gallium Nitride

Zhu, Changfei F., Fong, W.K., Leung, B.H., Cheng, C.C., Surya, C.

Materials Research Society
7 Conference Proceedings Low-frequency noise characterizations of GaN-based visible-blind UV detectors fabricated using a double buffer layer structure

H. F. Lui, W. K. Fong, C. Surya

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Study of Laser-Debonded GaN Light Emitting Diodes

Chan, C. P., Yue, T. M., Surya, C., Ng, A. M. C., Djuri-tic, A. B., Liu, C. K., Li, M.

Materials Research Society
8 Conference Proceedings Degradation Mechanism of GaN-Based LEDs With Different Growth Parameters

Ka Kuen Leung, W.K.P. Fong, Paddy Kwok Leung Chan, Charles Surya

Materials Research Society
3 Conference Proceedings Characterization of G-R Noise in GaN Films Grown by RF-MBE on Intermediate-Temperature Buffer Layers

Fong, W.K., Leung, B.H., Zhu, C.F., Surya, Charles

Materials Research Society
9 Conference Proceedings Low-frequency noise in GaN-based two-dimensional structures (Invited Paper)

Roumiantsev, S.L., Shur, M.S.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Low Frequency Noise Characterization In AlGaN/GaN HEMTs With Varying Gate Recess Depth

Jha, Shrawan. K., Leung, Bun. H., Surya, Charles C., Schweizer, Heins, Pilkhuhn, Manfred. H.

Materials Research Society
10 Conference Proceedings Low frequency noise in SOI transistors (Invited Paper)

Tseng, T., Woo, J. C. S.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Effect of indium surfactant on the optical and structural properties of MBE-grown GaN

Fong,W.K., Zhu,C.F., Surya,C., Leung,B.H., Cheng,C.C., Sundaravel,B., Luo,E.Z., Xu,J.B., Wilson,I.H.

SPIE - The International Society for Optical Engineering
11 Conference Proceedings Characterization of 1/f noise in GaN-based HEMTs under high dc voltage stress (Invited Paper)

Jha, S. K., Zhu, C. F., Jelenkovic, E., Tong, K. Y., Surya, C., Schweizer, H., Pilkuhn, M.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Low-frequency noise measurements: applications, methodologies and instrumentation (Invited Paper)

Ciofi, C., Neri, B.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Noise induced dimension changing bifurcations (Invited Paper)

Schwartz, I. B., Billings, L., Morgan, D. S., Lai, Y. C.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12