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Comparison of low-frequency noise in III-V and Si/SiGe HBTs (Invited Paper)

Author(s):
Pascal, F. ( Univ. Montpellier II (France) )
Guenard-Jarrix, S. ( Univ. Montpellier II (France) )
Delseny, C. ( Univ. Montpellier II (France) )
Penarier, A. ( Univ. Montpellier II (France) )
Chay, C. ( Univ. Montpellier II (France) )
Deen, M.J. ( Univ. Montpellier II (France) )
1 more
Publication title:
Noise in Devices and Circuits
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5113
Pub. Year:
2003
Page(from):
133
Page(to):
146
Pages:
14
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449733 [0819449733]
Language:
English
Call no.:
P63600/5113
Type:
Conference Proceedings

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