Impact of down scaling on high-frequency noise performance of bulk and SOI MOSFETs (Invited Paper)
- Author(s):
Dambrine, G. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) ) Raynaud, C. ( STMicroelectronics (France) ) Vanmackelberg, M. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) ) Danneville, F. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) ) Pailloncy, G. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) ) Lepilliet, S. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) ) Raskin, J.P. ( Univ. Catholique de Louvain (Belgium) ) - Publication title:
- Noise in Devices and Circuits
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5113
- Pub. Year:
- 2003
- Page(from):
- 105
- Page(to):
- 119
- Pages:
- 15
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449733 [0819449733]
- Language:
- English
- Call no.:
- P63600/5113
- Type:
- Conference Proceedings
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