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Non-Gaussian 1/f noise as a probe of long-range structural and electronic disorder in amorphous silicon

Author(s):
Publication title:
Noise as a Tool for Studying Materials
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5112
Pub. Year:
2003
Page(from):
67
Page(to):
77
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449726 [0819449725]
Language:
English
Call no.:
P63600/5112
Type:
Conference Proceedings

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