Engineering the pupil phase to improve image quality (Invited Paper)

Engineering the pupil phase to improve image quality (Invited Paper)

Author(s):

Prasad, S. ( Univ. of New Mexico (USA) )
Torgersen, T.C. ( Wake Forest Univ. (USA) )
Pauca, V.P. ( Wake Forest Univ. (USA) )
Plemmons, R.J. ( Wake Forest Univ. (USA) )
Van der Gracht, J. ( HoloSpex, Inc. (USA) )

Publication title:

Visual Information Processing XII

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5108

Pub. Year:

2003

Page(from):

1

Page(to):

12

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449689 [0819449687]

Language:

English

Call no.:

P63600/5108

Type:

Conference Proceedings

Details

TDL ID:	ZA00013097
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Visual Information Processing
Conf. info. (Number):	2003 : 12th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2003.04.21

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